IEC IEC63364-1 Edition 1.02022-12 NTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices - Semiconductor devices for loT system - Part 1: Test method of sound variation detection Dispositifs a semiconducteurs - Dispositifs a semiconducteurs pour systeme IDO Partie 1: Methode d'essai de detection de variation acoustique IEC 63364-1:2022-12(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright @ 2022 IEC, Geneva, Switzerland or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from copyright or have an enquiry about obtaining additional rights to this publication, piease contact the address below or your local IEC member National Committee for further information. Droits de reproduction reserves. Sauf indication contraire, aucune partie de cette publication ne peut etre reproduite ni utilisee sous quelqueforme que ce soit etparaucun procéde,électroniqueoumecanique,y compris la photocopie et les microfilms, sans I'accord écrit de I'lEc ou du Comite national de I'IEC du pays du demandeur. Si vous avez des questions sur le copyright de I'lEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de I'lEC de votre pays de residence. IEC Secretariat Tel.: +41 22 919 02 11 3, rue de Varembé
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